By Keith Brindley
The most goal of this e-book is to demystify computerized try gear. current literature on computerized attempt gear is usually written by way of engineers who examine automated attempt gear from inside-out. although, engineers will not be popular for prime features of authorship. different major assets of literature are around the world criteria. yet those don't often clarify computerized try out gear; as an alternative they purely formalize its part components. From any present literature hence it's tough to invite the question,''What is computerized try out equipment''? and discover a passable resolution. This booklet is for an individual who has an curiosity in automated attempt gear - a person within the who must be aware of what different types of gear can be found, what each one variety is in a position to doing, what checks are played, what desktop buses are used, what the buses are in a position to, etc, will locate solutions the following. Managers, engineers, technicians, scientists, scholars, teaches, graduates, these in paying for positions should still profit. it's a general-purpose ebook, and is the reason suggestions, and likewise a reference publication which defines necessities
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Additional resources for Automatic Test Equipment
Circuits found not to work are checked to see if faults can be determined - typically operators follow step-by-step instructions for manual placement of measurement probes. 1 Electro-optical functional test system (Racal) probe placement are available, in the forms of movable guided probes or bed-of-nails fixtures. Ability to perform fault determination to any great diagnostic resolution depends largely on complexity of the automatic test equipment system; however, some functional testers do not feature this ability at all.
One way round this is to use moving probe fixtures, which effectively eliminate need of simultaneous access by perhaps thousands of test point probes onto a circuit board. Instead, two or more probes are moved around above the board, actually locating on the board only at required circuit nodes. Thus, no mechanical fixture is required — a board simply locates directly onto the automatic test equipment system, while no more than about four moving probes effectively take the place of literally thousands of stationary probes.
These are then electroless nickel plated, then gold plated. Occasionally, rhodium plating is used instead of gold, giving a harder finish; desirable for some applications. 2 and spring Typical spring contact test probe, showing barrel, plunger Barrels and receptacles are drawn from nickel silver, often pre-plated or alloyed with gold although phosphor bronze or beryllium copper are sometimes used where stronger parts are needed. Spring material depends more closely on requirements: beryllium copper is used for lowest electrical resistance, stainless steel for high temperature applications, while music wire is used for highest spring force.
Automatic Test Equipment by Keith Brindley